The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Jun. 20, 2013
Kistler Holding Ag, Winterthur, CH;
Denis Kohler, Neftenbach, CH;
KISTLER HOLDING AG, Winterthur, CH;
Abstract
A measuring element formed of a piezoelectric crystal of symmetry class 32 for measuring a force Fz, which acts perpendicularly on the plane x-y and causes a charge accumulation on surfaces of the plane x-y. Applications are measurements in which the transverse forces Fxy orthogonal to the force Fz, which generate an error signal at the measuring element, are expected on the measuring body. The measuring element includes at least four identical measuring element segments having straight edges. In the x-y plane the segments are arranged side by side and spaced apart by narrow gaps at the edges. Together, the segments form the shape of a disc or perforated disc for reducing the interference signals caused by the transverse forces Fxy on the measuring element. The crystal orientations in the x-y plane of all segments are oriented in the same direction or orthogonal to each other.