The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Nov. 15, 2011
Grigori Temkine, Ontario, CA;
Filipp Chekmazov, Ontario, CA;
Paul Edelshteyn, Ontario, CA;
Oleg Drapkin, Ontario, CA;
Kristina AU, Ontario, CA;
Grigori Temkine, Ontario, CA;
Filipp Chekmazov, Ontario, CA;
Paul Edelshteyn, Ontario, CA;
Oleg Drapkin, Ontario, CA;
Kristina Au, Ontario, CA;
ATI Technologies ULC, Markham, CA;
Abstract
A system and method for measuring integrated circuit (IC) temperature. An integrated circuit (IC) includes a thermal sensor and data processing circuitry. The thermal sensor utilizes switched currents provided to a reference diode and a thermal diode. The ratios of the currents provided to each of these diodes may be chosen to provide a given delta value between the resulting sampled diode voltages. At a later time, a different ratio of currents may be provided to each of these diodes to provide a second given delta value between the resulting sampled diode voltages. A differential amplifier within the data processing circuitry may receive the analog sampled voltages and determine the delta values. Other components within the data processing circuitry may at least digitize and store one or both of the delta values. A difference between the digitized delta values may calculated and used to determine an IC temperature digitized code.