The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
May. 28, 2013
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Hyoung-ki Lee, Seongnam-si, KR;
Dong-geon Kong, Yongin-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 8/4444 (2013.01); A61B 8/4483 (2013.01); A61B 8/54 (2013.01); A61B 8/461 (2013.01); A61B 8/5223 (2013.01);
Abstract
A method of measuring propagation of a shear wave by using an ultrasound transducer includes generating a shear wave inside the object, setting a region of interest (ROI) on which propagation of the shear wave is to be observed, and determining a position of a second focus on which ultrasound signals are to be directed to obtain information about the ROI, irradiating the ultrasound signals toward the second focus, and receiving echo signals reflected from the ROI.