The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Jun. 30, 2015
Bar Ilan University, Ramat Gan, IL;
University of Connecticut, Farmington, CT (US);
Zeev Zalevsky, Ramat Gan, IL;
Moshe Arie Ariel Schwarz, Ramat Gan, IL;
Amir Shemer, Ramat Gan, IL;
Bahram Javidi, Storrs, CT (US);
Jingang Wang, Shandong, CN;
UNIVERSITY OF CONNECTICUT, Farmington, CT (US);
BAR ILAN UNIVERSITY, Ramat Gan, IL;
Abstract
An imaging system is provided, configured for providing three-dimensional data of a region of interest. The system comprising: an optical unit and a control unit. The optical unit comprises a radiation collection unit and a detection unit. The radiation collection unit comprises at least two mask arrangement defining at least two radiation collection regions respectively, the mask arrangements are configured to sequentially apply a plurality of a predetermined number of spatial filtering patterns formed by a predetermined arrangement of apertures applied on radiation collected thereby generating at least two elemental image data pieces corresponding to the collected radiation from said at least two collection regions. The control unit comprising is configured for receiving and processing said at least two elemental image data pieces and determining a plurality of at least two restored elemental images respectively being together indicative of a three dimensional arrangement of the region being imaged.