The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Dec. 07, 2012
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Alex Penev, New South Wales, AU;
Mark Ronald Tainsh, New South Wales, AU;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/222 (2006.01); H04N 5/232 (2006.01); H04N 1/00 (2006.01); H04N 101/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23293 (2013.01); H04N 1/0044 (2013.01); H04N 5/23206 (2013.01); H04N 2101/00 (2013.01);
Abstract
A method of selecting an image captured on an image capture device () is disclosed. A captured image is displayed on a display () associated with the image capture device (). A viewer image of a viewer viewing the captured image displayed on the display () is captured using the image capture device (). The captured image and the viewer image are compared to identify at least one common feature in the captured image and the viewer image. The captured image is selected if the at least one common feature is identified in both the captured image and the viewer image.