The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

May. 20, 2013
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Fan Zhang, Shenzhen, CN;

Honglin Liu, Shenzhen, CN;

Chun Yang, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 29/08 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01); H04L 29/06 (2006.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04L 67/10 (2013.01); H04L 12/2697 (2013.01); H04L 41/5051 (2013.01); H04L 43/50 (2013.01); H04L 63/08 (2013.01); H04W 24/08 (2013.01);
Abstract

Embodiments of the present invention provide an application test method based on a service delivery platform, and a service delivery platform. The method includes: receiving a service request message sent by an application server; determining whether the service request is a test request; if the service request is a test request, parsing the test request and obtaining a test instruction; and performing, according to the test instruction, a corresponding action and returning a corresponding response to the application server. With the method and the service delivery platform provided in the embodiments of the present invention, tests of all interfaces and service logic of an application can be covered without a test blind spot; and application test costs are decreased in the light of operators and application developers.


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