Semiconductor integrated circuit and power-supply voltage adaptive control system

Abstract

A semiconductor integrated circuit has N input terminals; N output terminals; a plurality of flip-flops (FFs) including N FFs and R redundant FFs; a selector section configured to select N selected FFs from the plurality of FFs depending on reconfiguration information and to switch data flow such that data input to the N input terminals are respectively output to the N output terminals by the N selected FFs; and an error detection section. In a test mode, the N FFs form a scan chain and a scan data is input to the scan chain. The error detection section detects an error FF included in the N FFs based on scan input/output data respectively input/output to/from the N FFs in the test mode and further generates the reconfiguration information such that the detected error FF is excluded from the N selected FFs.