The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Jul. 23, 2014
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Zahi S. Abuhamdeh, Billerica, MA (US);
Michael Ricchetti, Nashua, NH (US);
Richard Lombard, Millbury, MA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A system may measure a first sample, of a first signal, using an undersampling signal. The system may measure a second sample, of a second signal, using the undersampling signal. The undersampling signal may have a frequency that is based on a frequency of the first signal or a frequency of the second signal. The system may detect, based on measuring the first sample, a first edge of the first signal. The system may detect, based on measuring the second sample, a second edge of the second signal. The system may determine a delay, associated with the first signal and the second signal, based on detecting the first edge, based on detecting the second edge, based on a first cycle time of the undersampling signal, and based on a second cycle time of the first signal or the second signal.