The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Feb. 18, 2015
Applicant:

Techwing Co., Ltd., Hwaseong-si, Gyeonggi-do, KR;

Inventors:

Jin-Bok Lee, Hwaseong-si, KR;

Gun Wo Lee, Uijeongbu-si, KR;

Assignee:

TECHWING CO., LTD., Hwaseong-si, Gyeonggi-do, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/687 (2006.01); H01L 21/677 (2006.01); H01L 21/66 (2006.01); H01L 21/68 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67721 (2013.01); G01R 31/2893 (2013.01); H01L 21/67706 (2013.01); H01L 21/68 (2013.01); H01L 21/68764 (2013.01); H01L 21/68771 (2013.01); H01L 21/68778 (2013.01); H01L 22/34 (2013.01);
Abstract

A handler for testing a semiconductor device which is used when testing the fabricated semiconductor device. The handler for testing a semiconductor device includes a stacker to supply and accommodate a customer tray and a position selecting device to move the stacker and select a position of the stacker. By efficiently operating the stacker, the handler is able to continuously handle a large amount of semiconductor devices in a same testing process or continuously handle semiconductor devices in different lots, and equipment is prevented from becoming larger or having more complex designs so that required space, production costs and manpower are reduced and operating rates are improved.


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