The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Aug. 27, 2014
Applicant:

Agilent Technologies, Inc., Santa Clara, CA (US);

Inventor:

Curt A. Flory, San Jose, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/42 (2006.01); H01J 49/02 (2006.01); H01J 49/06 (2006.01); H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
H01J 49/004 (2013.01); H01J 49/0027 (2013.01); H01J 49/025 (2013.01); H01J 49/063 (2013.01); H01J 49/26 (2013.01); H01J 49/4285 (2013.01);
Abstract

In a tandem mass spectrometry system, a first mass analyzer filters parent ions using a wide mass passband with a narrow rejection notch defined according to a modulation format. A wide mass range of parent ions is transmitted to an ion fragmentation device. Daughter ions produced thereby are transmitted to a second mass analyzer to produce a daughter ion mass spectrum. The modulation of the measured daughter ion mass spectrum, when correlated with the passband modulation of the first mass analyzer (i.e., parent ion spectrum), allows definitive identification of each daughter mass peak with the appropriate parent ion. Due to the wide mass passband, the ion detector signal is in proportion to the increased ion flux passed by the first mass analyzer.


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