The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Jun. 06, 2012
Applicants:

Lifan Chen, Fremont, CA (US);

Haifeng Wang, Morgan Hill, CA (US);

Liang Hong, Pleasanton, CA (US);

Nattaporn Khamnualthong, Lamlukka, TH;

Inventors:

Lifan Chen, Fremont, CA (US);

Haifeng Wang, Morgan Hill, CA (US);

Liang Hong, Pleasanton, CA (US);

Nattaporn Khamnualthong, Lamlukka, TH;

Assignee:

Western Digital (Fremont), LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/07 (2006.01); H01J 37/244 (2006.01); H01J 49/04 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0004 (2013.01); H01J 37/07 (2013.01); H01J 37/244 (2013.01);
Abstract

A method for characterizing a carbon overcoat is provided. The method includes performing electron energy loss spectroscopy (EELS) spectrum imaging for an area of a preselected carbon-based material and an area of the carbon overcoat to generate a reference EELS dataset and a carbon overcoat EELS dataset, respectively, and determining a carbon bonding content of the carbon overcoat based on the reference EELS dataset and the carbon overcoat EELS dataset.


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