The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Aug. 25, 2014
Ricoh Company, Ltd.;
Tadashi Kitai, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image inspection system, an image inspection method, and an image inspection program acquires a read image obtained by reading an output image, generates an inspection image for inspecting the read image based on data of a to-be-output image, acquires an inspection result including a determination whether the read image is defective, based on a difference between the inspection image and the read image, acquires coloring-material usage data indicating extent of coloring-material usage in the output image, the coloring-material usage data being read when the read image is generated, generates coloring-material usage defect rate data indicating a defect rate in association with coloring-material usage, based on the inspection result and the coloring-material usage data, and obtains coloring-material usage of the to-be-output image, based on data of pixels forming the to-be-output image.