The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Mar. 27, 2015
Faro Technologies, Inc., Lake Mary, FL (US);
Reinhard Becker, Ludwigsburg, DE;
Martin Ossig, Tamm, DE;
Jurgen Gittinger, Ludwigsburg, DE;
Helmut Kramer, Mainbernheim, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
A method for optically scanning and measuring a scene by a three-dimensional (3D) measurement device in which multiple scans are generated to then be registered in a joint coordinate system of the scene. At first at least one cluster is generated from at least one scan, further scans are registered for test purposes in the coordinate system of the cluster, if specified quality criteria are fulfilled and the generated clusters are then joined, for which purpose clusters are selected, registered for test purposes and registering is confirmed if appropriate, wherein the clusters to be joined are visualized with an optional possibility for the user to intervene, for supporting the selection of clusters.