The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Nov. 07, 2013
Applicants:

Inter-university Research Institute Corporation, Research Organization of Information and Systems, Tokyo, JP;

The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);

Inventors:

Shoko Utsunomiya, Tokyo, JP;

Kenta Takata, Tokyo, JP;

Yoshihisa Yamamoto, Stanford, CA (US);

Kai Wen, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 99/00 (2010.01); B82Y 10/00 (2011.01);
U.S. Cl.
CPC ...
G06N 99/002 (2013.01); B82Y 10/00 (2013.01);
Abstract

For each pair of a plurality of slave lasers B for which injection synchronization is performed by a master laser M, by controlling the intensity of light exchanged between two slave lasers B and an optical path length between the two slave lasers B using a slave-to-laser intensity control unit IA and an inter-slave laser optical path length control unit IP, the magnitude and the sign of pseudo ising interaction Jbetween the two slave lasers B are implemented. After the plurality of slave lasers B arrive at a steady state, by measuring relative values of the oscillation phases of the plurality of slave lasers B with respect to the oscillation phase of the master laser M by using an oscillation phase measuring unit PM, pseudo ising spins σof the plurality of slave lasers B are measured.


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