The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Jan. 24, 2014
Applicant:

Accenture Global Services Limited, Dublin, IE;

Inventors:

Chen Fu, Cupertino, CA (US);

Mark Grechanik, Chicago, IL (US);

Qing Xie, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 21/62 (2013.01);
U.S. Cl.
CPC ...
G06F 17/3053 (2013.01); G06F 21/6254 (2013.01);
Abstract

At least one quasi-identifier attribute of a plurality of ranked attributes is selected for use in anonymizing a database. Each of the ranked attributes is ranked according to that attribute's effect on a database-centric application (DCA) being tested. In an embodiment, the selected quasi-identifier attribute(s) has the least effect on the DCA. The database is anonymized based on the selected quasi-identifier attribute(s) to provide a partially-anonymized database, which may then be provided to a testing entity for use in testing the DCA. In an embodiment, during execution of the DCA, instances of database queries are captured and analyzed to identify a plurality of attributes from the database and, for each such attribute identified, the effect of the attribute on the DCA is quantified. In this manner, databases can be selectively anonymized in order to balance the requirements of data privacy against the utility of the data for testing purposes.


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