The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Feb. 25, 2011
John Oliver Burness, Colorado Springs, CO (US);
Richard Franklin Lary, Colorado Springs, CO (US);
John Oliver Burness, Colorado Springs, CO (US);
Richard Franklin Lary, Colorado Springs, CO (US);
SEAGATE TECHNOLOGY LLC, Scotts Valley, CA (US);
Abstract
A hierarchical compression tester and associated method employs a grid-based storage capacity wherein a storage unit is defined by a grouping of data blocks. Each data block is stored in one of a plurality of storage devices. Each stored data block has a data portion and a data integrity field (DIF) including a data reliability qualifier (DRQ) indicating whether the respective data portion is valid. The tester also has a logical device allocation map that includes a storage unit descriptor array that identifies one or more storage units corresponding to a selected logical address. The logical device allocation map has a DIF array that identifies whether any of the data blocks in the one or more storage units corresponding to the selected logical address includes invalid data.