The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Jul. 02, 2009
Applicants:

Liang-jie Zhang, Cortlandt Manor, NY (US);

Yi-min Chee, Yorktown Heights, NY (US);

Teresa Abdel-hamid, Columbus, OH (US);

Nianjun Zhou, Danbury, CT (US);

Inventors:

Liang-Jie Zhang, Cortlandt Manor, NY (US);

Yi-Min Chee, Yorktown Heights, NY (US);

Teresa Abdel-Hamid, Columbus, OH (US);

Nianjun Zhou, Danbury, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06Q 10/00 (2012.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06F 8/36 (2013.01); G06F 8/10 (2013.01); G06Q 10/06375 (2013.01);
Abstract

Traceability management to align IT solution artifacts with business goals in a service oriented architecture environment is provided. A pattern matching framework is provided for generating patterns and transformation enablers for architectural artifacts based on specific business requirements. Patterns that are applicable to a selected set of artifacts or model are provided to an architect, who may then select a particular subset of the patterns to apply to the set of artifacts or model in the SOA solution design to speed up and simplify the design process. Providing applicable or candidate patterns for selection to the architect in the views reduces the possible ambiguity in architectural artifact-pattern matching and selection. These solution patterns may be used as a guide when configuring and linking architectural artifacts and models.


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