The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Feb. 28, 2011
Applicants:

Mikael Wahlsten, Stockholm, SE;

Per-erik Gustafsson, Solna, SE;

Inventors:

Mikael Wahlsten, Stockholm, SE;

Per-Erik Gustafsson, Solna, SE;

Assignee:

MYCRONIC AB, Taby, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G03F 9/00 (2006.01); G03F 7/20 (2006.01); H05K 3/46 (2006.01);
U.S. Cl.
CPC ...
G03F 9/7003 (2013.01); G03F 7/70383 (2013.01); H05K 3/4679 (2013.01);
Abstract

In a method for patterning a workpiece provided with dies in a direct write machine, pattern data associated with a selected die, or group of dies, is transformed into adjusted circuit pattern data dependent both on the original pattern data and the transformed positions, wherein the adjusted circuit pattern data represents the circuit pattern of the plurality of dies, or group of dies, such that the adjusted circuit pattern is fitted to a plurality of sub-areas of the workpiece area, and wherein each sub-area is associated with a die, or group of dies, among the plurality of dies distributed on the workpiece. A pattern is then written on the workpiece according to the adjusted circuit pattern data.


Find Patent Forward Citations

Loading…