The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Aug. 22, 2011
Applicants:

Takashi Miyauchi, Kawasaki, JP;

Kentaro Miyazaki, Yokohama, JP;

Inventors:

Takashi Miyauchi, Kawasaki, JP;

Kentaro Miyazaki, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/04 (2006.01); G02B 27/22 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G02B 27/2214 (2013.01); G01N 2021/9513 (2013.01);
Abstract

According to one embodiment, the system for inspecting a cell substrate is provided. The inspection system includes: a signal generator transmitting to a cell substrate a display signal causing the cell substrate to display a test image; an imaging apparatus capturing the test image displayed on the cell substrate; a parallax image generator arranging the set of parallax image information of the captured test image for each parallax image to generate a parallax image prediction of parallax image which is obtained when the cell substrate is bonded to the lenticular lens; and an interface apparatus displaying the parallax image predictions.


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