The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Dec. 19, 2013
Applicants:
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Inventors:
Huaping Tang, Beijing, CN;
Yuanjing Li, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yaohong Liu, Beijing, CN;
Zhanfeng Qin, Beijing, CN;
Jinyu Zhang, Beijing, CN;
Hu Tang, Beijing, CN;
Assignees:
TSINGHUA UNIVERSITY, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0016 (2013.01);
Abstract
This invention relates to an X-ray goods inspection apparatus, and in particular to a goods inspection apparatus using distributed X-ray source.