The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

May. 09, 2012
Applicants:

Yukinori Iizuka, Tokyo, JP;

Takafumi Ozeki, Tokyo, JP;

Yutaka Matsui, Tokyo, JP;

Inventors:

Yukinori Iizuka, Tokyo, JP;

Takafumi Ozeki, Tokyo, JP;

Yutaka Matsui, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/07 (2006.01); G01N 29/04 (2006.01); G01N 29/265 (2006.01); G01N 29/11 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/043 (2013.01); G01N 29/041 (2013.01); G01N 29/07 (2013.01); G01N 29/11 (2013.01); G01N 29/265 (2013.01); G01N 29/4427 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/2634 (2013.01); Y10T 29/49764 (2015.01);
Abstract

An ultrasonic flaw detection method to detect flaws on an inner surface of a metallic pipe using ultrasonic waves includes a waveform hold step that acquires and holds waveform data of an echo signal when an ultrasonic probe that generates ultrasonic signals toward the inner surface and the metallic pipe are moved relative to each other, a signal analyzing step that calculates a path length up to receiving an echo signal from the inner surface and a change rate of the path length based on the waveform data held, and a flaw detecting step that detects flaws on the inner surface based on the path length and the change rate of the path length.


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