The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Dec. 03, 2014
Applicant:

Rolls-royce Corporation, Indianapolis, IN (US);

Inventors:

Joseph Peter Henderkott, Westfield, IN (US);

Kong Ma, Carmel, IN (US);

Assignee:

Rolls-Royce Corporation, Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 25/72 (2006.01); G06T 7/00 (2006.01); G01F 1/00 (2006.01); G01J 5/50 (2006.01); G01K 13/02 (2006.01); G06T 3/00 (2006.01); H04N 5/33 (2006.01); F01D 5/14 (2006.01); F01D 5/18 (2006.01); F01D 17/02 (2006.01); F01D 17/10 (2006.01); F01D 17/12 (2006.01); F01D 17/14 (2006.01); F01D 17/20 (2006.01); F01D 17/24 (2006.01); F01D 21/10 (2006.01); F01D 25/00 (2006.01); F01D 5/00 (2006.01); F01D 9/04 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 25/72 (2013.01); F01D 5/00 (2013.01); F01D 5/14 (2013.01); F01D 5/147 (2013.01); F01D 5/186 (2013.01); F01D 5/187 (2013.01); F01D 9/041 (2013.01); F01D 17/02 (2013.01); F01D 17/10 (2013.01); F01D 17/12 (2013.01); F01D 17/14 (2013.01); F01D 17/20 (2013.01); F01D 17/24 (2013.01); F01D 21/10 (2013.01); F01D 25/002 (2013.01); G01F 1/00 (2013.01); G01J 5/505 (2013.01); G01K 13/02 (2013.01); G06T 3/0068 (2013.01); G06T 7/001 (2013.01); G06T 7/0008 (2013.01); G06T 7/0026 (2013.01); G06T 7/0032 (2013.01); H04N 5/33 (2013.01); F05D 2260/83 (2013.01); G01J 2005/0081 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A system may include a source of dry ice, a thermal camera, and a computing device. The computing device may be configured to control the source of dry ice to cause dry ice to be introduced into an internal passage of a tested component. The tested component may include debris within the internal passage, and the dry ice may remove at least some of the debris from the internal passage. The computing device also may be configured to receive, from the thermal camera, thermographic image data representative of the thermal response of the tested component and output a representation based on the thermographic image data.


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