The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Oct. 15, 2013
Applicant:

Pulsetor, Llc, Ringoes, NJ (US);

Inventors:

Nicholas C. Barbi, Yardley, PA (US);

Richard B. Mott, Ringoes, NJ (US);

Assignee:

PulseTor, LLC, Pennington, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); H01J 37/28 (2006.01); G01N 23/225 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2257 (2013.01); G01T 1/2018 (2013.01); H01J 37/244 (2013.01); H01J 37/28 (2013.01); H01J 2237/2443 (2013.01); H01J 2237/24415 (2013.01);
Abstract

An X-ray detector includes a housing and an X-ray sensing device provided within the housing along the axis of the housing, wherein the housing is structured to be coupled to the electron column or sample chamber of a charged particle beam device. The X-ray detector also includes an electron detector structured to detect a plurality of electrons ejected from a sample in response to an electron beam impinging on the sample, the electron detector being coupled to the housing on or near the axis such that a first line of sight to the electron detector from a point at which the electron beam impinges on the sample is similar to a second line of sight to the X-ray sensing device from the point at which the electron beam impinges on the sample such that X-ray and Backscattered electron images will show similar parallax and shadowing effects.


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