The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Sep. 24, 2013
Applicant:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Nicholas L. Abbott, Madison, WI (US);

I-Hsin Lin, Neutraubling, DE;

Christopher J. Murphy, Madison, WI (US);

Jugal Gupta, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/51 (2006.01); G01N 21/21 (2006.01); G01N 21/64 (2006.01); G01N 21/77 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/51 (2013.01); G01N 21/21 (2013.01); G01N 21/6428 (2013.01); G01N 21/77 (2013.01); G01N 2021/4704 (2013.01);
Abstract

Devices and methods for using changes in the defects in micrometer sized dispersed liquid crystal domains to detect or quantify analytes in a test sample, including endotoxin lipopolysaccharide (LPS), are disclosed. The dispersed liquid crystal microdomains are exposed to the test sample, and any changes in the number of defects in the liquid crystal microdomains are detected by detecting changes in the anchoring configuration of the microdomains. Such changes in anchoring configuration indicate the presence of analyte in the test sample.


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