The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Oct. 08, 2013
Applicant:

Agency for Science, Technology and Research, Singapore, SG;

Inventors:

Qing Liu, Singapore, SG;

Jack Sheng Kee, Singapore, SG;

Mi Kyoung Park, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); G01N 21/55 (2014.01); G02B 6/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/41 (2013.01); G01N 21/55 (2013.01); G02B 6/10 (2013.01);
Abstract

A refractive index sensor is provided for analyzing an analyte, the sensor including: a strip waveguide for receiving an input light signal therein and transmitting the light signal, subject to manipulation as it propagates through the strip waveguide, to a detector for analysis with respect to the analyte; and a slot waveguide for sensing the analyte disposed thereon and for receiving a sensing signal, corresponding to said manipulation of the light signal, from the strip waveguide, wherein a grating is formed on a surface of the strip waveguide to enable coupling of the sensing signal from the strip waveguide to the slot waveguide, and the sensor is configured with enhanced sensitivity based on a sensitivity difference between the slot waveguide and the strip waveguide, and/or a group index difference between the slot waveguide and the strip waveguide.


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