The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Aug. 06, 2012
Applicants:

Robert Jeffrey Geddes Carr, Wiltshire, GB;

John Patrick Hole, Wiltshire, GB;

Jonathan Benjamin Kendall Smith, Wiltshire, GB;

Inventors:

Robert Jeffrey Geddes Carr, Wiltshire, GB;

John Patrick Hole, Wiltshire, GB;

Jonathan Benjamin Kendall Smith, Wiltshire, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 15/14 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/14 (2013.01); G01N 15/0211 (2013.01); G01N 15/1459 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/025 (2013.01); G01N 2015/0222 (2013.01); G01N 2015/0238 (2013.01); G01N 2015/0277 (2013.01);
Abstract

The present invention provides a method of analyzing a sample comprising sub-micron particles, comprising determining first information about the size of particles and number of particles in the sample by nanoparticle tracking analysis; determining second information about average particle size of particles in the sample by dynamic light scattering; determining from the first information third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering; and adjusting the second information using the third information to produce fourth information representing adjusted information on average particle size.


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