The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Oct. 18, 2013
Applicant:

Crystal Instruments Corporation, Santa Clara, CA (US);

Inventors:

James Q. Zhuge, Palo Alto, CA (US);

Zhengge Tang, San Jose, CA (US);

Lei Chen, HangZhou, CN;

Assignee:

Crystal Instruments Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2015.01); H04B 17/00 (2015.01); H04Q 1/20 (2006.01); G01D 18/00 (2006.01); G01D 9/00 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G01D 9/005 (2013.01);
Abstract

In a data acquisition instrument with dual A/D converters in each measurement channel, phase corrections between the paths are computed using a locally generated calibration signal. The calibration signal goes through dual paths simultaneously and is stitched into a single signal for analysis by a processor running a Fourier transform where phase differences are easily identified and used to establish a phase correction signal applied to a single master clock supplying clock signals to both paths. A switch allows the calibration signal to be applied to each channel or to no channels when actual data is being collected.


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