The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Nov. 25, 2010
Applicants:

Heinz Lippuner, Rebstein, CH;

Urs Vokinger, Au, CH;

Knut Siercks, Moerschwil, CH;

Inventors:

Heinz Lippuner, Rebstein, CH;

Urs Vokinger, Au, CH;

Knut Siercks, Moerschwil, CH;

Assignee:

LEICA GEOSYSTEMS AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01D 5/244 (2006.01);
U.S. Cl.
CPC ...
G01D 5/24452 (2013.01);
Abstract

The invention relates to a calibration method that can be carried out without a reference system for an angle measuring device having a code carrier carrying an absolute position code, and at least two reading heads comprising a fixed, known angle position at an angular distance, wherein the code carrier can be rotated relative to the reading heads, and different angle positions of the code carrier relative to the reading heads can thus be captured. Angle position values of the reading heads in an angular setting are determined and angular error is determined, which are repeated. And, a mathematical analysis method is performed, including determining the parameters of a mathematical function quantifying the angular error, and determining calibration parameters as parameters of the quantifying mathematical function or as a correction or code table derived from the parameters.


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