The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Sep. 24, 2013
Nihon Yamamura Glass Co., Ltd., Amagasaki-shi, Hyogo, JP;
Naohiro Tanaka, Amagasaki, JP;
Goro Tambo, Amagasaki, JP;
NIHON YAMAMURA GLASS CO., LTD., Hyogo, JP;
Abstract
A wall thickness inspection device includes an electrostatic capacity detectorfor detecting the electrostatic capacity of a portion of an object subjected to wall thickness inspection, and an arithmetic and control unit for taking in the electrostatic capacity detected by the electrostatic capacity detectorand converting the electrostatic capacity to a wall thickness. The electrostatic capacity detectorincludes a sensor unitbrought into contact with the surface of a portion of the object subjected to the wall thickness inspection, and an elastic bodyfor biasing the sensor unittoward the portion of the object. The sensor unithas a curved surfacewith the radius of curvature R represented by 2 mm≦R≦10 mm. The curved surfaceis formed by bonding an electrode sheetmade of synthetic resin having each electrode pattern formed thereon to a belt-like attachment substrateso that at least the electrode pattern of a measurement electrode from among the electrode pattern of the measurement electrode and the electrode pattern of an earth electrode is positioned on the surface of a curved portion of the attachment substrate