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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9339890 B1

PDFFull Text
Date of Patent:
May. 17, 2016

Filed:

Dec. 13, 2011

Optimization and control of beam quality for material processing

Applicants:

Kenneth J. Woods, Lyme, NH (US);

Sanjay Garg, Hanover, NH (US);

Tate S. Picard, Enfield, NH (US);

Inventors:

Kenneth J. Woods, Lyme, NH (US);

Sanjay Garg, Hanover, NH (US);

Tate S. Picard, Enfield, NH (US);

Assignee:

Hypertherm, Inc., Hanover, NH (US);

Attorney:

Proskauer Rose LLP

Primary Examiner:

Dana Ross

Assistant Examiner:

Joseph Iskra

Int. Cl.
CPC ...
B23K 26/00 (2014.01); B23K 26/06 (2014.01); B23K 26/20 (2014.01); B23K 26/34 (2014.01); B23K 26/36 (2014.01); B23K 26/38 (2014.01); G02B 6/42 (2006.01);
U.S. Cl.
CPC ...
B23K 26/06 (2013.01); B23K 26/042 (2015.10); B23K 26/20 (2013.01); B23K 26/34 (2013.01); B23K 26/36 (2013.01); B23K 26/38 (2013.01); B23K 26/382 (2015.10); G02B 6/4206 (2013.01); G02B 6/4296 (2013.01); G02B 6/4226 (2013.01);
Abstract

Systems and methods are provided for adjusting a laser beam applied to a workpiece in a processing operation. A laser processing system receives the laser beam that is associated with a beam quality property. The laser processing system adjusts the laser beam to change the beam quality property based on a characteristic of the workpiece, a characteristic of the processing operation, or a combination thereof. The adjusted laser beam can also be delivered to the workpiece.

Find Patent Forward Citations

Woods, Kenneth. (2016). Optimization and control of beam quality for material processing (U.S. Patent No. 9339890). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9339890

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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