The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Feb. 29, 2012
Applicant:

Matthew J. A. Rickard, Yorba Linda, CA (US);

Inventor:

Matthew J. A. Rickard, Yorba Linda, CA (US);

Assignee:

Alcon Research, Ltd., Fort Worth, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/16 (2006.01); A61F 9/007 (2006.01);
U.S. Cl.
CPC ...
A61B 3/16 (2013.01); A61F 9/00781 (2013.01);
Abstract

An IOP monitoring device for implantation in an eye of a patient may include a first tube having a first opening, the first tube being configured to extend into an anterior chamber of the eye and extend to a first sensor outside the anterior chamber. The first sensor may be in fluid communication with the first opening of the first tube. The device also may include a second tube having an opening spaced from a second sensor. The opening of the second tube may be configured to be exposed to a pressure representative of atmospheric pressure, with the second sensor being in fluid communication with the second opening. In one aspect, a patch is attachable to a globe of the eye and configured to lie over the opening of the second tube and secure the opening in place in the eye.


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Rickard, Matthew J. A.. (2016). External pressure measurement system and method for an intraocular implant (U.S. Patent No. 9339187). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9339187

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