The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Feb. 06, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Futoshi Hirose, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
In order to reduce a measurement range of an aberration of an eye to be inspected, provided is an imaging apparatus, including: a first image acquiring unit for acquiring a first image of the eye based on first return light from the eye irradiated with first measuring light via a first focus unit for focusing the first measuring light on the eye; a second image acquiring, by using an aberration correction unit, unit for acquiring a second image of an area corresponding to a part of the first image of the eye based on second return light from the object to be inspected irradiated with second measuring light via a second focus unit for focusing the second measuring light on the eye; and a focus adjustment unit for adjusting a focus condition of the second focus unit based on a focus condition of the first focus unit.