The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Jul. 02, 2015
Elwha Llc, Bellevue, WA (US);
Allen L. Brown, Jr., Bellevue, WA (US);
Douglas C. Burger, Bellevue, WA (US);
Eric Horvitz, Kirkland, WA (US);
Roderick A. Hyde, Redmond, WA (US);
Edward K. Y. Jung, Bellevue, WA (US);
Jordin T. Kare, San Jose, CA (US);
Chris Demetrios Karkanias, Sammamish, WA (US);
Eric C. Leuthardt, St. Louis, MO (US);
John L. Manferdelli, San Francisco, CA (US);
Craig J. Mundie, Seattle, WA (US);
Nathan P. Myhrvold, Medina, WA (US);
Barney Pell, San Francisco, CA (US);
Clarence T. Tegreene, Mercer Island, WA (US);
Willard H. Wattenburg, Chico, CA (US);
Charles Whitmer, North Bend, WA (US);
Lowell L. Wood, Jr., Bellevue, WA (US);
Richard N. Zare, Stanford, CA (US);
Elwha LLC, Bellevue, WA (US);
Abstract
Methods and systems for determining a physiological parameter of a subject through interrogation of an eye of the subject with an optical signal are described. Interrogation is performed unobtrusively. The physiological parameter is determined from a signal sensed from the eye of a subject according to a schedule, under the control of a scheduling controller.