The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Aug. 26, 2015
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventor:

Vincent C. Barnes, El Paso, TX (US);

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/49 (2006.01); H04L 25/08 (2006.01); H03F 3/21 (2006.01); H04L 27/36 (2006.01); H03F 1/32 (2006.01);
U.S. Cl.
CPC ...
H04L 25/08 (2013.01); H03F 1/3241 (2013.01); H03F 1/3247 (2013.01); H03F 3/21 (2013.01); H04L 27/367 (2013.01);
Abstract

In an example, an apparatus for signal classification in a digital pre-distortion (DPD) system includes a positive frequency path including a first half-band low pass filter (LPF) operable to filter samples of an input digital samples after positive frequency translation; a negative frequency path including a second half-band LPF operable to filter the samples of the input digital samples after negative frequency translation; a power estimation circuit coupled to the positive frequency path and the negative frequency path, the power estimation circuit operable to determine a first average power based on output of the first half-band LPF, a second average power based on output of the second half-band LPF, and a total average power of the input digital samples; and a controller operable to determine a frequency content metric from the first average power and the second average power, and to select a set of filter coefficients for the DPD system based on the frequency content metric and the total average power.


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