The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Jun. 22, 2015
Applicant:

The United States of America As Represented BY the Secretary of the Navy, Washington, DC (US);

Inventors:

David R. Emerson, Ellettsville, IN (US);

Gregory D. Hughes, Dale City, VA (US);

Nixon A. Pendergrass, Nashville, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/10 (2015.01); H01Q 21/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/102 (2015.01); H01Q 21/0087 (2013.01);
Abstract

A system adapted for use with an electromagnetic transmitter and receiver system is provided comprising an electromagnetic transmitter and receiver system comprising an antenna, wherein the electromagnetic transmitter and receiver system is adapted to produce a transmitted signal for antenna pattern measurement which is transmitted through the antenna; a case located in proximity to the electromagnetic transmitter; at least one measurement probe disposed inside the case without changing the antenna's emission pattern, wherein the case, with the probe dispose therein, is placed no closer to the antenna than a limitation on the transmitter and receiver system component comprising a dynamic range associated with radio frequency energy received by the probe from the antenna; and an output section adapted to send results from the antenna pattern measurement received by the probe to a remote location away from the transmitter and receiver system for recording and analysis, the analysis comprising producing an antenna pattern measurement for the transmitter and receiver system.


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