The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Oct. 19, 2012
Applicant:

Ut-battelle, Llc, Oak Ridge, TN (US);

Inventors:

Beth L. Armstrong, Clinton, TN (US);

Claus Daniel, Knoxville, TN (US);

Jane Y. Howe, Oak Ridge, TN (US);

James O. Kiggans, Jr., Oak Ridge, TN (US);

Adrian S. Sabau, Knoxville, TN (US);

David L. Wood, III, Knoxville, TN (US);

Sergiy Kalnaus, Knoxville, TN (US);

Assignee:

UT-BATTELLE, LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 3/02 (2006.01); B05D 3/06 (2006.01); H01M 4/04 (2006.01);
U.S. Cl.
CPC ...
H01M 4/04 (2013.01); H01M 4/0435 (2013.01); H01M 4/0471 (2013.01); H01M 4/0485 (2013.01);
Abstract

A method of drying casted slurries that includes calculating drying conditions from an experimental model for a cast slurry and forming a cast film. An infrared heating probe is positioned on one side of the casted slurry and a thermal probe is positioned on an opposing side of the casted slurry. The infrared heating probe may control the temperature of the casted slurry during drying. The casted slurry may be observed with an optical microscope, while applying the drying conditions from the experimental model. Observing the casted slurry includes detecting the incidence of micro-structural changes in the casted slurry during drying to determine if the drying conditions from the experimental model are optimal.


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