The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Jun. 19, 2013
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
Jagadeesh Sankaran, Allen, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); H04N 9/80 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4604 (2013.01); G06K 2009/4666 (2013.01);
Abstract
A method (and system) of determining a local binary pattern in an image includes selecting an orientation. For each pixel in the image, the method further includes determining a binary decision for each such pixel relative to one neighboring pixel of the orientation, selecting a new orientation, and repeating the determination of the binary decision for each pixel in the image relative to one neighboring pixel of the newly selected orientation.