The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Jun. 20, 2014
Applicant:

Morpho, Issy-les-Moulineaux, FR;

Inventors:

Alain Thiebot, Issy-les-Moulineaux, FR;

Benjamin Peyron-Neaud, Issy-les-Moulineaux, FR;

Benoît Thouy, Issy-les-Moulineaux, FR;

Florence Guillemot, Issy-les-Moulineaux, FR;

Gilles Monteilliet, Issy-les-Moulineaux, FR;

Assignee:

MORPHO, Issy-les-Moulineaux, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/73 (2006.01); H04N 5/235 (2006.01); G06K 9/00 (2006.01); G06K 9/20 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00288 (2013.01); G06K 9/00248 (2013.01); G06K 9/00255 (2013.01); G06K 9/00906 (2013.01); G06K 9/2018 (2013.01); G06K 9/2036 (2013.01);
Abstract

Detecting a true face includes: capturing a parallel image of a face captured by a camera having a filter polarizing parallel to a polarization direction and an orthogonal image of the face captured by a camera's filter polarizing orthogonally to the polarization direction; computing a difference image from difference between the parallel and orthogonal images; filtering the difference image in wavelet packets on 5 levels, eliminating 'low' resolution levels; dividing the filtered image into sub-images; the filtered image and each sub-image undergoes: a Fourier or discreet cosine transformation; and modelling during which the frequency decrease profile is modelled by a model of the power type (a.x^b+c); extracting, from the filtered image and each sub-image, texture characteristics of face surface specularities; analyzing, for each face region, coefficient 'b' and the texture characteristics extracted regarding the model corresponding to said face region; and deciding the veracity of the face from the analysis.


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