The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

May. 09, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Young Sam Shin, Hwaseong-si, KR;

Seung Won Lee, Hwaseong-si, KR;

Shi Hwa Lee, Seoul, KR;

Min Young Son, Hwaseong-si, KR;

Jae Don Lee, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/34 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 11/0721 (2013.01); G06F 11/0763 (2013.01);
Abstract

An apparatus and method for detecting an error occurring when an application program is executed in a computer environment is provided. The error detection apparatus may measure a deterministic progress index (DPI) and a program counter (PC) value when an instruction is executed, set, as a verification set, a DPI and a PC value measured when the instruction is executed without causing an error, set, as a measurement set, the DPI and the PC value measured when an instruction is executed, and detect a runtime error of the instruction by comparing the measurement set to the verification set.


Find Patent Forward Citations

Loading…