The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Aug. 19, 2013
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Falk Schlaudraff, Butzbach/Nieder-Weisel, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A specimen slide () having a sample region () in which a sample () that can be investigated microscopically can be arranged, and that comprises reference points (A-Z, 1-24, a-j, α-κ) arranged at least in the sample region (), is proposed. The reference points (A-Z,-, a-j, α-κ) are embodied in such a way that on the basis of an identification of at least a stipulated number of reference points (A-Z, 1-24, a-j, α-κ) in an arbitrary sub-region () of the sample region (), the position of the arbitrary sub-region (), and/or at least one position therein, on the specimen slide () can be unequivocally determined A method for determining and/or retrieving a position on a corresponding specimen slide, and a corresponding sample investigation system, are likewise subjects of the invention.