The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Oct. 13, 2011
Guy Kennedy, Underhill Center, VT (US);
David M. Warshaw, South Burlington, VT (US);
Guy Kennedy, Underhill Center, VT (US);
David M. Warshaw, South Burlington, VT (US);
The University of Vermont and State Agricultural College, Burlington, VT (US);
Abstract
A new apparatus and method of delivering light to the hack aperture of a High Numerical Aperture (NA) Microscopy Objective lens for Total Internal Reflectance Microscopy (TIRFM) is provided. The apparatus and method include pumping light generated by a laser through an optical fiber which is optically coupled to the objective lens by a collimating optical element, such as, for example a lens or prism. The apparatus and method also include providing a fiber axial translator which is mechanically adjustable for focusing the laser light optically coupled to the objective lens. The apparatus also includes a mechanical coupler for mechanically coupling the apparatus to the object lens such that the laser light optically coupled to the objective lens can be adjusted to exceed, or not exceed, a critical angle associated with TIRFM illumination.