The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Nov. 03, 2014
Applicant:
Nanohmics, Inc., Austin, TX (US);
Inventors:
Byron G. Zollars, Georgetown, TX (US);
Steve M. Savoy, Austin, TX (US);
Michael W. Mayo, Austin, TX (US);
Daniel R. Mitchell, Austin, TX (US);
Assignee:
Nanohmics, Inc., Austin, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/14 (2006.01); G01S 3/782 (2006.01); G01S 3/781 (2006.01); G01J 1/42 (2006.01); G01J 1/04 (2006.01); G01S 3/784 (2006.01); H01L 31/0232 (2014.01); H01L 27/146 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01S 3/782 (2013.01); G01J 1/0411 (2013.01); G01J 1/0422 (2013.01); G01J 1/0492 (2013.01); G01J 1/4257 (2013.01); G01S 3/781 (2013.01); G01S 3/784 (2013.01); H01L 27/14621 (2013.01); H01L 27/14625 (2013.01); H01L 31/02327 (2013.01); G01J 2001/4266 (2013.01); G01J 2003/2813 (2013.01);
Abstract
Method and apparatus for determining direction from which electromagnetic radiation originates and spectral characteristics of the radiation are provided. Lenses, diffraction gratings, which may be present on the surface of the lenses, and mirrors direct radiation to a photodetector. Lens and grating parameters, along with the location, size, relative spacing and orientation of diffracted orders of radiation detected by the photodetector are used for determining direction from which the radiation originates.