The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Aug. 08, 2014
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Hiroshi Kurihara, Tokyo, JP;

Masataka Midori, Tokyo, JP;

Masashi Torii, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01); G01R 29/0821 (2013.01); G01R 29/0892 (2013.01);
Abstract

A far electromagnetic field estimation method includes assuming a measurement surface, setting a plurality of measurement points on the measurement surface, and measuring electromagnetic fields at the plurality of measurement points. The measurement surface in combination with a ground plane forms a closed surface surrounding a radiation source. A virtual observation point is outside a space formed inside the closed surface. Further, electromagnetic fields at a plurality of mirror image measurement points on a mirror image measurement surface having a plane-symmetrical relationship with the measurement surface are calculated on the basis of the electromagnetic fields at the plurality of measurement points. Then, a far electromagnetic field at the virtual observation point is estimated on the basis of the electromagnetic fields at the plurality of measurement points and at the plurality of mirror image measurement points.


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