The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Mar. 14, 2014
Applicant:
Vibrant Corporation, Albuquerque, NM (US);
Inventor:
Leanne Jauriqui, Albuquerque, NM (US);
Assignee:
VIBRANT CORPORATION, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/04 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/041 (2013.01); G01N 29/2462 (2013.01); G01N 29/4427 (2013.01); G01N 2291/103 (2013.01); G01N 2291/265 (2013.01); G01N 2291/2696 (2013.01);
Abstract
Various approaches for assessing a part for a defect are disclosed and that are based upon SAW modes. In one embodiment, a part-under-test () is excited. One or more SAW modes () are identified in the frequency response () of the part-under-test (). A SAW mode area () in the frequency response of the part-under-test () is compared with a baseline SAW mode area () of a baseline frequency response () (and which may be associated with an acceptable part). This comparison may be used to determine if the part-under-test () may be characterized defective in at least some respect.