The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Dec. 19, 2014
Applicant:

Nuctech Company Limited, Haidian District, Beijing, CN;

Inventors:

Zhiqiang Chen, Beijing, CN;

Ziran Zhao, Beijing, CN;

Jianhong Zhang, Beijing, CN;

Hongqiu Wang, Beijing, CN;

Yumin Yi, Beijing, CN;

Assignee:

Nuctech Company Limited, Haidian District, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/4412 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/12 (2013.01);
Abstract

An embodiment of the present invention provides a Raman spectroscopic detection method for detecting a sample in a vessel, comprising the steps of: (a) measuring a Raman spectrum of the vessel to obtain a first Raman spectroscopic signal; (b) measuring a Raman spectrum of the sample through the vessel to obtain a second Raman spectroscopic signal; (c) removing an interference caused by the Raman spectrum of the vessel from the second Raman spectroscopic signal on basis of the first Raman spectroscopic signal to obtain a third Raman spectroscopic signal of the sample itself; and (d) identifying the sample on basis of the third Raman spectroscopic signal. By means of the above method, the Raman spectrum of the sample in the vessel may be detected correctly so as to identify the sample to be detected efficiently.


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