The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Jan. 31, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Taichi Takemura, Abiko, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/46 (2006.01); G01N 21/27 (2006.01); G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/27 (2013.01); G03G 15/5062 (2013.01); G03G 2215/0164 (2013.01); G03G 2215/2006 (2013.01);
Abstract
A test chart on which measurement images are formed is conveyed in one direction. When the measurement images pass a color sensor, they undergo pre-scanning. A color sensor accumulation time is determined for each measurement image according to the pre-scanning. The test chart is subsequently conveyed in the one direction, whereupon the conveyance direction is changed. In this way, after the color sensor has completed pre-scanning for all of the measurement images, the test chart is once again conveyed toward the color sensor. When the test chart passes the color sensor again, main scanning of the measurement images is executed.