The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Dec. 03, 2014
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Hisashi Ode, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/17 (2006.01); G01N 29/06 (2006.01); G01N 29/24 (2006.01); G02B 21/00 (2006.01); G01B 21/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/1702 (2013.01); G01B 9/02007 (2013.01); G01B 9/02091 (2013.01); G01B 21/02 (2013.01); G01N 29/0672 (2013.01); G01N 29/0681 (2013.01); G01N 29/2418 (2013.01); G02B 21/002 (2013.01); G01N 2021/1706 (2013.01); G01N 2201/0697 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/08 (2013.01); G01N 2201/10 (2013.01); G01N 2201/125 (2013.01);
Abstract

Provided is a photoacoustic microscope, including: an objective lens configured to collect excitation light into a specimen, the excitation light in a wavelength range that is absorbed by an object to be observed; a detection light optical system configured to (i) form an image of a point light source of detection light in a middle portion of a pupil of the objective lens, the detection light having a wavelength that is different from the wavelength range of the excitation light, and (ii) emit the detection light onto the specimen by means of the objective lens; an optical scanning unit configured to deflect the excitation light and the detection light that enter the objective lens, for scanning the specimen; and a light detection unit configured to detect reflected light of the detection light that is reflected by the specimen.


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