The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Feb. 03, 2014
Duke University, Durham, NC (US);
Adam P. Wax, Chapel Hill, NC (US);
Michael G. Giacomelli, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
Systems and methods of angle-resolved low coherence interferometry based optical correlation are disclosed. According to an aspect, a method includes directing a sample beam towards a sample for producing a scattered sample beam from the sample. The method also includes receiving the scattered sample beam at a multitude of scattering angles in at least two directions. Further, the method includes cross-correlating the scattered sample beam with a reference beam to produce a two-dimensional angle and depth resolved profile of the sample scattered beam. The method also includes processing the two-dimensional angle and depth scattered profile to obtain correlated information about scattering structures in the sample.