The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Mar. 10, 2009
Daniel D. Friel, Sr., Greenville, DE (US);
Bela Elek, Wilmington, DE (US);
Daniel D. Friel, Sr., Greenville, DE (US);
Bela Elek, Wilmington, DE (US);
Abstract
A wide range of knives and blades, including Western, Asian or traditional Japanese style blades that have a primary edge facet on at least one side of the knife edge are sharpened through use of an electric knife sharpener having a first sharpening stage with at least one rotating abrasive surface disk and a knife angle guide to position the blade's facet at a first relative angle of approximately 15 degrees as it contacts the moving abrasive surface. The knife sharpener includes a second sharpening stage with at least one rotating abrasive surfaced disk and a knife angle guide to position the blade's facet at a second relative angle of approximately 20 degrees as it contacts the rotating abrasive surface. The knife sharpener also has a third stropping stage with at least one rotating stropping disk containing abrasive particles of less than 1 thousandth of inch diameter and a knife angle guide to position the blade's facet at a third relative angle larger than the first and second angles as it contacts the rotating surface of the stropping disk. The rotating sharpening and stropping disks are displaceable from a rest position against specific restraining forces when contacted by the edge facet being sharpened or stropped.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile