The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Oct. 03, 2012
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Sven Prevrhal, Hamburg, DE;

Eberhard Sebastian Hansis, Hamburg, DE;

Jason Stephen Wiener, Fremont, CA (US);

Joerg Bredno, San Francisco, CA (US);

David Sowards-Emmerd, San Jose, CA (US);

Lingxiong Shao, Saratoga, CA (US);

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01T 1/29 (2006.01); A61B 6/04 (2006.01); A61K 51/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/037 (2013.01); A61B 6/0407 (2013.01); A61B 6/469 (2013.01); A61B 6/481 (2013.01); A61B 6/5294 (2013.01); A61B 6/544 (2013.01); A61B 6/547 (2013.01); A61K 51/00 (2013.01); G01T 1/2985 (2013.01); A61K 2121/00 (2013.01); A61K 2123/00 (2013.01);
Abstract

In Positron Emission Tomography, a time window () and an energy window () are dynamically adjusted, based on an attenuation map, count rate, clinical application, discrimination tailoring, and/or offline discrimination tailoring. Detected radiation events are filtered using the dynamically adjusted energy and time windows into scattered events, random events, and true events. The true events are input to image reconstruction, correction, and error analysis.


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